Accurate measurement of interferometer group delay using field-compensated scanning white light interferometer

被引:5
|
作者
Wan, Xiaoke [1 ]
Wang, Ji [1 ]
Ge, Jian [1 ]
机构
[1] Univ Florida, Dept Astron, Bryant Space Sci Ctr 211, Gainesville, FL 32611 USA
基金
美国国家科学基金会;
关键词
MICHELSON INTERFEROMETER; DISPERSION;
D O I
10.1364/AO.49.005645
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Interferometers are key elements in radial velocity (RV) experiments in astronomy observations, and accurate calibration of the group delay of an interferometer is required for high precision measurements. A novel field-compensated white light scanning Michelson interferometer is introduced as an interferometer calibration tool. The optical path difference (OPD) scanning was achieved by translating a compensation prism, such that even if the light source were in low spatial coherence, the interference stays spatially phase coherent over a large interferometer scanning range. In the wavelength region of 500-560 nm, a multimode fiber-coupled LED was used as the light source, and high optical efficiency was essential in elevating the signal-to-noise ratio of the interferogram signal. The achromatic OPD scanning required a one-time calibration, and two methods using dual-laser wavelength references and an iodine absorption spectrum reference were employed and cross-verified. In an experiment measuring the group delay of a fixed Michelson interferometer, Fourier analysis was employed to process the interferogram data. The group delay was determined at an accuracy of 1 x 10(-5), and the phase angle precision was typically 2.5 x 10(-6) over the wide wavelength region. (C) 2010 Optical Society of America
引用
收藏
页码:5645 / 5653
页数:9
相关论文
共 50 条
  • [31] White-light interferometer with dispersion:: an accurate fiber-optic sensor for the measurement of distance
    Pavlícek, P
    Häusler, G
    APPLIED OPTICS, 2005, 44 (15) : 2978 - 2983
  • [32] Advanced signal processing in a white-light scanning interferometer for exact surface profile measurement
    Luo, Songjie
    Sasaki, Osami
    Choi, Samuel
    Suzuki, Takamasa
    Pu, Jixiong
    OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS V, 2018, 10819
  • [33] White-light scanning interferometer for absolute nano-scale gap thickness measurement
    Xu, Zhiguang
    Shilpiekandula, Vijay
    Youcef-toumi, Kamal
    Yoon, Soon Fatt
    OPTICS EXPRESS, 2009, 17 (17): : 15104 - 15117
  • [34] Three-dimensional measurement of multilayer thin films based on scanning white light interferometer
    Shi Zhendong
    Zhang Lin
    Ren Huan
    Yuan Quan
    Yang Yi
    Ma Hua
    8TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGY: OPTICAL TEST, MEASUREMENT TECHNOLOGY, AND EQUIPMENT, 2016, 9684
  • [35] WHITE-LIGHT SCANNING FIBER MICHELSON INTERFEROMETER FOR ABSOLUTE POSITION-DISTANCE MEASUREMENT
    LI, TC
    WANG, A
    MURPHY, K
    CLAUS, R
    OPTICS LETTERS, 1995, 20 (07) : 785 - 787
  • [36] Measurement of the refractive index of an optical medium by using a white-light interferometer
    Nahm, KB
    Shin, ES
    Rhee, BK
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1996, 29 (06) : 724 - 727
  • [37] Elimination of dispersion effect in a white-light scanning interferometer by using a spectral analyzer
    Luo, Song-Jie
    Sasaki, Osami
    Liu, Yong-Xin
    Li, Xiao-Yan
    Lin, Zhi-Li
    Pu, Ji-Xiong
    OPTICAL REVIEW, 2017, 24 (01) : 27 - 32
  • [38] Elimination of dispersion effect in a white-light scanning interferometer by using a spectral analyzer
    Song-Jie Luo
    Osami Sasaki
    Yong-Xin Liu
    Xiao-Yan Li
    Zhi-Li Lin
    Ji-Xiong Pu
    Optical Review, 2017, 24 : 27 - 32
  • [39] Accurate profile measurement of spherical surfaces using an interferometer
    Qiang, XF
    Gao, W
    Kiyono, S
    JSME INTERNATIONAL JOURNAL SERIES C-MECHANICAL SYSTEMS MACHINE ELEMENTS AND MANUFACTURING, 2001, 44 (03): : 650 - 655
  • [40] Gauge block measurement using a wavelength scanning interferometer
    Bitou, Youichi, 2000, JJAP, Tokyo (39):