Measurement of the refractive index of an optical medium by using a white-light interferometer

被引：0
|
作者：
Nahm, KB [1 ]
Shin, ES [1 ]
Rhee, BK [1 ]
机构：
[1] SOGANG UNIV,DEPT PHYS,SEOUL 121742,SOUTH KOREA
来源：
JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 1996年 / 29卷 / 06期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
A white-light interferometer (WLI) was used to measure the refractive index of some standard optical materials. The laser diode from a commercial CD player with a median frequency at 780 nm was used as the light source for the WLI. With a sample length of 10 mm, the refractive index could be determined to four decimal places. It was found that the accuracy in measuring the refractive index depended on the accuracy in measuring the length of the sample.
引用
收藏
页码：724 / 727
页数：4
相关论文
共 50 条
  • [1] Heterodyne white-light interferometer using optical grating
    Hirai, A
    Matsumoto, H
    APPLICATIONS OF PHOTONIC TECHNOLOGY 4: CLOSING THE GAP BETWEEN THEORY, DEVELOPMENT, AND APPLICATION, 2000, 4087 : 1102 - 1105
  • [2] Measurements of refractive indices and thermo-optical coefficients using a white-light Michelson interferometer
    Rocha, A. C. P.
    Silva, J. R.
    Lima, S. M.
    Nunes, L. A. O.
    Andrade, L. H. C.
    APPLIED OPTICS, 2016, 55 (24) : 6639 - 6643
  • [3] Measurement of the group refractive index of bulk material using white-light spectral interferometry
    Zhang Shu-Na
    Luo Zhen-Yue
    Shen Wei-Dong
    Liu Xu
    Zhang Yue-Guang
    ACTA PHYSICA SINICA, 2011, 60 (01)
  • [4] Nanodisplacement measurement using spectral shifts in a white-light interferometer
    Brundavanam, Maruthi M.
    Viswanathan, Nirmal K.
    Rao, D. Narayana
    APPLIED OPTICS, 2008, 47 (34) : 6334 - 6339
  • [5] Surface measurement through transparent medium using Linnik type white-light spectral interferometer
    Guo, Tong
    Weng, Qianwen
    Chen, Zhuo
    Fu, Xing
    Hu, Xiaotang
    SIXTH INTERNATIONAL CONFERENCE ON OPTICAL AND PHOTONIC ENGINEERING (ICOPEN 2018), 2018, 10827
  • [6] Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer
    Hlubina, P
    OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION II: APPLICATION IN INDUSTRIAL DESIGN, 2001, 4398 : 229 - 237
  • [7] Direct measurement of refractive-index dispersion of transparent media by white-light interferometry
    Galli, M
    Marabelli, F
    Guizzetti, G
    APPLIED OPTICS, 2003, 42 (19) : 3910 - 3914
  • [8] White-light spectral interferometry with the uncompensated Michelson interferometer and the group refractive index dispersion in fused silica
    Hlubina, P
    OPTICS COMMUNICATIONS, 2001, 193 (1-6) : 1 - 7
  • [9] Visually identifying the refractive index using surface plasmons excited by white-light
    Ozaki, Miyu
    Furutani, Ryoshu
    OPTICAL ENGINEERING, 2024, 63 (01)
  • [10] White-light Fizeau interferometer
    Schwider, J
    APPLIED OPTICS, 1997, 36 (07): : 1433 - 1437
12345