Improved analyzer multilayers for aluminium and boron detection with x-ray fluorescence

被引：0
|
作者：
Ricardo, Paulo [1 ]
Wiesmann, Jörg [1 ]
Nowak, Claudia [1 ]
Michaelsen, Carsten [1 ]
Bormann, Rüdiger [1 ]
机构：
[1] Institute of Materials Research, GKSS Research Centre, 21502 Geesthacht, Germany
来源：
Applied Optics | 2001年 / 40卷 / 16期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Multilayers
引用
收藏
页码：2747 / 2754
相关论文
共 50 条
  • [1] Improved analyzer multilayers for aluminium and boron detection with x-ray fluorescence
    Ricardo, P
    Wiesmann, J
    Nowak, C
    Michaelsen, C
    Bormann, R
    APPLIED OPTICS, 2001, 40 (16) : 2747 - 2754
  • [2] The Application of Improved GMDH Network to the Portable X-Ray Fluorescence Analyzer
    Li Fei
    Ge Liang-quan
    Luo Yao-yao
    Zhang Qing-xian
    Gu Yi
    SPECTROSCOPY AND SPECTRAL ANALYSIS, 2013, 33 (06) : 1711 - 1713
  • [3] ON X-RAY FLUORESCENCE OF THIN LAYERS AND MULTILAYERS
    DAHL, H
    SCHULZ, G
    ZEITSCHRIFT FUR ANGEWANDTE PHYSIK, 1970, 29 (02): : 117 - &
  • [4] Energy dispersive x-ray fluorescence analyzer with several x-ray tubes
    Borisov, GI
    Kondratenko, RI
    Mikhin, VA
    Odinov, BV
    Pukhov, AV
    X-Ray and Neutron Capillary Optics II, 2005, 5943 : 322 - 325
  • [5] Energy-resolving X-ray fluorescence detection using synthetic multilayers
    Zhang, K
    Rosenbaum, G
    Bunker, G
    JOURNAL OF SYNCHROTRON RADIATION, 1998, 5 : 1227 - 1234
  • [6] Grazing emission x-ray fluorescence from multilayers
    Urbach, HP
    de Bokx, PK
    PHYSICAL REVIEW B, 2001, 63 (08):
  • [7] Gauge of an energy-dispersive X-ray fluorescence analyzer
    Bukin, KV
    Nakhabtsev, VS
    Romanova, NE
    Kirillov, VN
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1998, 41 (03) : 393 - 397
  • [8] Analysis of mineral cosmetics with a handheld X-ray fluorescence analyzer
    Thomas, Sara
    Nguyen, Grace
    Stokes, Diamond
    Ngo, Tiffany Tieu
    Benvenuto, Mark
    Roberts-Kirchhoff, Elizabeth
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2017, 253
  • [9] X-ray fluorescence wafer analyzer improves semiconductor fabrication
    Reader, A
    Nieuwenhuizen, K
    SOLID STATE TECHNOLOGY, 1996, : S16 - S19
  • [10] Doubly focusing crystal analyzer for X-ray fluorescence holography
    Marchesini, S
    Belakhovsky, M
    Freund, AK
    CRYSTAL AND MULTILAYER OPTICS, 1998, 3448 : 224 - 228
12345