ON X-RAY FLUORESCENCE OF THIN LAYERS AND MULTILAYERS

被引:0
|
作者
DAHL, H
SCHULZ, G
机构
来源
ZEITSCHRIFT FUR ANGEWANDTE PHYSIK | 1970年 / 29卷 / 02期
关键词
D O I
暂无
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:117 / &
相关论文
共 50 条
  • [1] Thin layers and multilayers of porous silicon: x-ray diffraction investigation
    Journal of Applied Physics, 1998, 83 (11 pt 1):
  • [2] Thin layers and multilayers of porous silicon: X-ray diffraction investigation
    Buttard, D
    Bellet, D
    Dolino, G
    Baumbach, T
    JOURNAL OF APPLIED PHYSICS, 1998, 83 (11) : 5814 - 5822
  • [3] Total-reflection X-ray fluorescence of thin layers on and in solids
    de, Boer, D.K.G.
    van den Hoogenhof, W.W.
    Proceedings of the Annual Conference on Applications of X-Ray Analysis, 1991,
  • [4] X-ray analysis of thin films and multilayers
    Fewster, PF
    REPORTS ON PROGRESS IN PHYSICS, 1996, 59 (11) : 1339 - 1407
  • [5] Grazing emission x-ray fluorescence from multilayers
    Urbach, HP
    de Bokx, PK
    PHYSICAL REVIEW B, 2001, 63 (08):
  • [6] X-ray scattering from thin films and multilayers
    Rafaja, D
    EUROPEAN POWDER DIFFRACTION EPDIC 8, 2004, 443-4 : 65 - 70
  • [7] Comparison of X-ray fluorescence and optical fluorescence measured behind scattering layers as a basis for X-ray fluorescence endoscopy
    Beuthan, J
    Haschke, M
    Dressler, C
    Wacker, F
    BIOMEDIZINISCHE TECHNIK, 2005, 50 (03): : 54 - 59
  • [8] Characterization of thin layers by X-ray reflectometry
    Zymierska, D
    Sobczak, E
    Godwod, K
    Miotkowska, S
    APPLIED CRYSTALLOGRAPHY, 1998, : 394 - 397
  • [9] EXPRESSION OF CONCENTRATION OF THE MEASURED ELEMENT FOR THE X-RAY FLUORESCENCE ANALYSIS METHOD IN THIN LAYERS
    Chuev, Anatoly
    Nagaev, Emil
    Taraskin, Anton
    Chernyaev, Alexander
    ENERGY AND CLEAN TECHNOLOGIES CONFERENCE PROCEEDINGS, SGEM 2016, VOL I, 2016, : 19 - 23
  • [10] X-RAY TOPOGRAPHY OF THIN SUBSURFACE LAYERS
    AFANASEV, AM
    ALEKSANDROV, PA
    IMAMOV, RM
    PASHAEV, EM
    POLOVINKINA, VI
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1985, 90 (02): : 419 - 423