Improved analyzer multilayers for aluminium and boron detection with x-ray fluorescence

被引：0
|
作者：
Ricardo, Paulo [1 ]
Wiesmann, Jörg [1 ]
Nowak, Claudia [1 ]
Michaelsen, Carsten [1 ]
Bormann, Rüdiger [1 ]
机构：
[1] Institute of Materials Research, GKSS Research Centre, 21502 Geesthacht, Germany
来源：
Applied Optics | 2001年 / 40卷 / 16期
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摘要：
Multilayers
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页码：2747 / 2754
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