Improved analyzer multilayers for aluminium and boron detection with x-ray fluorescence

被引：0

作者：

Ricardo, Paulo ^{[1
]}

Wiesmann, Jörg ^{[1
]}

Nowak, Claudia ^{[1
]}

Michaelsen, Carsten ^{[1
]}

Bormann, Rüdiger ^{[1
]}

机构：

[1] Institute of Materials Research, GKSS Research Centre, 21502 Geesthacht, Germany

来源：

Applied Optics | 2001年 / 40卷 / 16期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Multilayers

引用

页码：2747 / 2754

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