DETERMINING IC LAYOUT RULES FOR COST MINIMIZATION

被引：12
|
作者：
RUNG, RD
机构：
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1981年 / 16卷 / 01期
关键词：
D O I：
10.1109/JSSC.1981.1051533
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：35 / 43
页数：9
相关论文
共 50 条
  • [21] IC ALIGNMENT AND LAYOUT CONSIDERATIONS.
    Strom, Stephen
    Electronic Packaging and Production, 1980, 20 (03): : 149 - 151
  • [22] Automation of IC layout with analog constraints
    Malavasi, E
    Charbon, E
    Felt, E
    SangiovanniVincentelli, A
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1996, 15 (08) : 923 - 942
  • [23] CAD TOOLS FOR CUSTOM IC LAYOUT
    Singer, Peter H.
    Semiconductor International, 1985, 8 (12) : 56 - 62
  • [24] SURVEY OF AUTOMATIC IC LAYOUT SOFTWARE
    不详
    VLSI SYSTEMS DESIGN, 1988, 9 (04): : 40 - &
  • [25] CONSTRAINT SOLVER FOR GENERALIZED IC LAYOUT
    COOK, PW
    IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1984, 28 (05) : 581 - 589
  • [26] Complexity and Diversity in IC Layout Design
    Otten, Ralph
    PROCEEDINGS OF THE 2016 INTERNATIONAL SYMPOSIUM ON PHYSICAL DESIGN (ISPD'16), 2016, : 115 - 115
  • [27] Material Handling Cost Minimization Through Facility Layout Design Using Particle Swarm Optimization Method
    Dowluru, Sreeramulu
    Madivada, Hymavathi
    Prasanth, Grandhi
    Bammidi, Roopsandeep
    Muddada, Venkatesh
    ADVANCED NETWORK TECHNOLOGIES AND INTELLIGENT COMPUTING, ANTIC 2023, PT IV, 2024, 2093 : 187 - 202
  • [28] Solving the problem of determining the optimal location of the logistics center, taking into account cost minimization
    Kulakova, I. M.
    Lebedeva, O. A.
    Poltavskaya, J. O.
    INTERNATIONAL CONFERENCE ON MODERN TRENDS IN MANUFACTURING TECHNOLOGIES AND EQUIPMENT (ICMTMTE) 2020, 2020, 971
  • [29] An Inverter Layout Technique for Propagation Delay Minimization
    Yu, Ji-Hak
    Kwon, Chan-Keun
    Moon, Junil
    Kim, Soo-Won
    2015 IEEE INTERNATIONAL SYMPOSIUM ON CONSUMER ELECTRONICS (ISCE), 2015,
  • [30] Effect of IC layout on the reliability of CMOS amplifiers
    He, Feifei
    Tan, Cher Ming
    MICROELECTRONICS RELIABILITY, 2012, 52 (08) : 1575 - 1580
12345