CHARGE PUMPING MEMORY WITH SOS-MOS TRANSISTORS

被引:1
|
作者
SASAKI, N
NAKANO, M
IWAI, T
机构
关键词
D O I
10.7567/JJAPS.19S1.155
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:155 / 160
页数:6
相关论文
共 50 条
  • [31] Surface potential determination in irradiated MOS transistors combining current-voltage and charge pumping measurements
    Masson, P
    Autran, JL
    Raynaud, C
    Flament, O
    Paillet, P
    Chabrerie, C
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (03) : 1355 - 1364
  • [32] ISLAND-EDGE EFFECTS IN C-MOS-SOS TRANSISTORS
    LEE, SN
    KJAR, RA
    KINOSHITA, G
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (08) : 971 - 978
  • [33] Charge collection in impact ionization MOS transistors
    Wang, W.
    2005 IEEE CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS, PROCEEDINGS, 2005, : 699 - 702
  • [34] CHARGE PUMPING MEASUREMENTS ON STEPPED-GATE METAL-NITRIDE-OXIDE-SILICON MEMORY TRANSISTORS
    MAES, HE
    USMANI, SH
    JOURNAL OF APPLIED PHYSICS, 1982, 53 (10) : 7106 - 7108
  • [35] CHARGE-PUMPING IN THIN-FILM TRANSISTORS
    SAKS, NS
    BATRA, S
    MANNING, M
    MICROELECTRONIC ENGINEERING, 1995, 28 (1-4) : 379 - 382
  • [36] Diagram representations of charge pumping processes in CMOS transistors
    Huang Xinyun
    Jiao Guangfan
    Shen Chen
    Cao Wei
    Huang Darning
    Li Mingfu
    JOURNAL OF SEMICONDUCTORS, 2010, 31 (08)
  • [37] Diagram representations of charge pumping processes in CMOS transistors
    黄新运
    焦广泛
    沈忱
    曹伟
    黄大鸣
    李名复
    半导体学报, 2010, 31 (08) : 53 - 59
  • [38] In-depth exploration of Si-SiO2 interface traps in MOS transistors using the charge pumping technique
    Bauza, D
    Maneglia, Y
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1997, 44 (12) : 2262 - 2266
  • [39] A COMPLEMENTARITY OF THE 1/F NOISE AND THE CHARGE-PUMPING METHODS FOR DETERMINATION OF THE DEGRADATION OF THE SMALL SIZE MOS-TRANSISTORS
    GRABOWSKI, F
    STOLARSKI, E
    MICROELECTRONICS RELIABILITY, 1992, 32 (11) : 1621 - 1626
  • [40] EVALUATION OF CHANNEL HOT CARRIER EFFECTS IN N-MOS TRANSISTORS AT 77-K WITH THE CHARGE PUMPING TECHNIQUE
    HEREMANS, P
    SUN, YC
    GROESENEKEN, G
    MAES, HE
    APPLIED SURFACE SCIENCE, 1987, 30 (1-4) : 313 - 318