A PRACTICAL CURRENT SENSING TECHNIQUE FOR I-DDQ TESTING

被引：34
|
作者：
TANG, JJ
LEE, KJ
LIU, BD
机构：
[1] Department of Electrical Engineering, National Cheng-Kung University, Tainan
来源：
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 1995年 / 3卷 / 02期
关键词：
D O I：
10.1109/92.386229
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper, a practical design for built-in current sensors (BICS's) is proposed. This scheme can execute current testing during the normal circuit operation with very small impact on the performance of the circuit under test (CUT). In addition, scalable resolutions and no external voltage/current reference make this design more effective and efficient than previous designs. Moreover this scheme can be used to monitor the current-related faults of both CMOS and non-CMOS circuits. Thus it is highly suitable for design for testability (DFT) on a multiple-chip module (MCM) or to be the current monitor on the test fixture under the quality test action group (QTAG) standard [1].
引用
收藏
页码：302 / 310
页数：9
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