Using I-DDQ drift testing to detect hydrogen in MOS devices

被引：0
|
作者：
Sabin, E
Nagalingam, S
Lemke, S
机构：
来源：
1997 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 35TH ANNUAL | 1997年
关键词：
D O I：
10.1109/RELPHY.1997.584237
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：57 / 65
页数：9
相关论文
共 40 条
  • [1] I-DDQ TESTING FINDS FURTHER FAULTS
    NOVELLINO, J
    ELECTRONIC DESIGN, 1995, 43 (18) : 77 - &
  • [2] I-DDQ testing: Issues present and future
    Soden, JM
    Hawkins, CF
    IEEE DESIGN & TEST OF COMPUTERS, 1996, 13 (04): : 61 - 65
  • [3] An efficient compact test generator for I-DDQ testing
    Kondo, H
    Cheng, KT
    PROCEEDINGS OF THE FIFTH ASIAN TEST SYMPOSIUM (ATS '96), 1996, : 177 - 182
  • [4] On estimating bounds of the quiescent current for I-DDQ testing
    Ferre, A
    Figueras, J
    14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1996, : 106 - 111
  • [5] Delta I-DDQ Testing of CMOS Data Converters
    Yellampalli, S.
    Srivastava, A.
    JOURNAL OF ACTIVE AND PASSIVE ELECTRONIC DEVICES, 2009, 4 (1-2): : 63 - 89
  • [6] A PRACTICAL CURRENT SENSING TECHNIQUE FOR I-DDQ TESTING
    TANG, JJ
    LEE, KJ
    LIU, BD
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 1995, 3 (02) : 302 - 310
  • [7] MICROPROCESSOR I-DDQ TESTING - A CASE-STUDY
    JOSEPHSON, D
    STOREY, M
    DIXON, D
    IEEE DESIGN & TEST OF COMPUTERS, 1995, 12 (02): : 42 - 52
  • [8] Possibilities and limitations of I-DDQ Testing in submicron CMOS
    Figueras, J
    SECOND ANNUAL IEEE INTERNATIONAL CONFERENCE ON INNOVATIVE SYSTEMS IN SILICON, 1997 PROCEEDINGS, 1997, : 174 - 185
  • [9] Dealing with yield losses in I-DDQ testing: Viewpoint
    Hawkins, CF
    Soden, JM
    IEEE SPECTRUM, 1996, 33 (01) : 68 - 69
  • [10] Algorithms to select I-DDQ measurement points to detect bridging faults
    Chakravarty, S
    Thadikaran, PJ
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1996, 8 (03): : 275 - 285
1234