Automated Data Analysis Solutions to Silicon Debug

被引：0
|
作者：
Yang, Yu-Shen [1 ]
Nicolici, Nicola [2 ]
Veneris, Andreas [3 ]
机构：
[1] Univ Toronto, Dept ECE, Toronto, ON M5S 3G4, Canada
[2] McMaster Univ, Dept ECE, Hamilton, ON L8S 4K1, Canada
[3] Univ Toronto, Dept ECE & CS, Toronto, ON M5S 3G4, Canada
来源：
DATE: 2009 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3 | 2009年
关键词：
HARDWARE; DESIGNS;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper presents an automated software solution to analyze the data collected during silicon debug. The proposed methodology analyzes the test sequences to detect suspects in both the spatial and the temporal domain. A set of software debug techniques are proposed to analyze the acquired data from the hardware testing and provide suggestions for the setup of the test environment in the next debug session. A comprehensive set of experiments demonstrate its effectiveness in terms of run-time and resolution.
引用
收藏
页码：982 / +
页数：2
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