BackSpace: Formal Analysis for Post-Silicon Debug

被引:0
|
作者
De Paula, Flavio M. [1 ]
Gort, Marcel [2 ]
Hu, Alan J. [1 ]
Wilton, Steven J. E. [2 ]
Yang, Jin [3 ]
机构
[1] Univ British Columbia, Dept Comp Sci, Vancouver, BC V5Z 1M9, Canada
[2] Univ British Columbia, Dept Comp Sci & Elect Engn, Vancouver, BC, Canada
[3] Intel Corp, Santa Clara, CA USA
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D O I
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中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Post-silicon debug is the problem of determining what's wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall verification effort on large designs, and the problem is growing worse. We introduce a new paradigm for using formal analysis' augmented with some on-chip hardware support, to automatically compute error traces that lead to an observed buggy state, thereby greatly simplifying the post-silicon debug problem. Our preliminary simulation experiments demonstrate the potential of our approach: we can "backspace" hundreds of cycles from randomly selected states of some sample designs. Our preliminary architectural studies propose some possible implementations and show that the on-chip overhead can be reasonable. We conclude by surveying future research directions.
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页码:35 / +
页数:2
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