共 50 条
- [41] Combinational Trace Signal Selection with Improved State Restoration for Post-Silicon Debug PROCEEDINGS OF THE 2016 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 2016, : 1369 - 1374
- [44] Razor: A tool for post-silicon scan ATPG pattern debug and its application 22ND IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2004, : 97 - 102
- [45] Using Introspective Software-Based Testing for Post-Silicon Debug and Repair PROCEEDINGS OF THE 47TH DESIGN AUTOMATION CONFERENCE, 2010, : 537 - 542
- [46] Flip-flop Clustering based Trace Signal Selection for Post-Silicon Debug 2017 IEEE 35TH VLSI TEST SYMPOSIUM (VTS), 2017,
- [47] Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries 2022 IEEE 40TH VLSI TEST SYMPOSIUM (VTS), 2022,
- [48] Structured Approach to Post-Silicon Validation and Debug Using Symbolic Quick Error Detection 2015 IEEE INTERNATIONAL TEST CONFERENCE (ITC), 2015,
- [49] On Reusing Test Access Mechanisms for Debug Data Transfer in SoC Post-Silicon Validation PROCEEDINGS OF THE 17TH ASIAN TEST SYMPOSIUM, 2008, : 303 - 308