Silicon odometer: An on-chip reliability monitor for measuring frequency degradation of digital circuits

被引：29
|
作者：
Kim, Tae-Hyoung [1 ]
Persaud, Randy [1 ]
Kim, Chris H. [1 ]
机构：
[1] Univ Minnesota, Dept ECE, Minneapolis, MN 55455 USA
来源：
2007 Symposium on VLSI Circuits, Digest of Technical Papers | 2007年
关键词：
D O I：
10.1109/VLSIC.2007.4342682
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A fully-digital reliability monitor is presented for high resolution frequency degradation measurements of digital circuits. The proposed scheme measures the beat frequency of two ring oscillators, one which is stressed and the other which is unstressed, to achieve 50X higher delay sensing resolution compared to prior techniques. A reliability monitor test chip has been fabricated in a 1.2V, 130nm CMOS technology.
引用
收藏
页码：122 / 123
页数：2
相关论文
共 50 条
  • [41] Reliability-aware design flow for silicon photonics on-chip interconnect
    1763, Institute of Electrical and Electronics Engineers Inc., United States (22):
  • [42] On-chip digital holographic interferometry for measuring wavefront deformation in transparent samples
    Mach, Marek
    Psota, Pavel
    Zidek, Karel
    Mokry, Pavel
    OPTICS EXPRESS, 2023, 31 (11) : 17185 - 17200
  • [43] Demonstration and Comparison of On-Chip High-Frequency Test Methods for RSFQ Circuits
    Li, Songrui
    Chen, Liyun
    Ying, Liliang
    Ren, Jie
    Wang, Zhen
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2023, 33 (05)
  • [44] Ultrahigh-sensitivity On-chip Power Monitor using a Resistive Microheater in a Silicon Waveguide
    Li, Dong
    Zhou, Linjie
    Chen, Jianping
    2016 IEEE 13TH INTERNATIONAL CONFERENCE ON GROUP IV PHOTONICS (GFP), 2016, : 16 - 17
  • [45] On-Chip NBTI and PBTI Tracking through an All-Digital Aging Monitor Architecture
    Alidash, Hossein Karimiyan
    Calimera, Andrea
    Macii, Alberto
    Macii, Enrico
    Poncino, Massimo
    INTEGRATED CIRCUIT AND SYSTEM DESIGN: POWER AND TIMING MODELING, OPTIMIZATION AND SIMULATION, 2013, 7606 : 155 - 165
  • [46] On-chip Digital Idn and Idp Measurement by 65 nm CMOS Speed Monitor Circuit
    Notani, H.
    Fujii, M.
    Suzuki, H.
    Makino, H.
    Shinohara, H.
    2008 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE, 2008, : 401 - +
  • [47] Evaluating On-Chip Interconnects for Low Operating Frequency Silicon Neuron Arrays
    Cassidy, Andrew
    Murray, Thomas
    Andreou, Andreas G.
    Georgiou, Julius
    2011 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2011, : 2437 - 2440
  • [48] On-chip hybrid integration of swept frequency distributed-feedback laser with silicon photonic circuits using photonic wire bonding
    Chowdhury, Sheri Jahan
    Wickremasinghe, Kithmin
    Grist, Samantha M.
    Zou, Hang
    Mitchell, Matthew
    Al-Qadasi, Mohammed A.
    Lin, Becky
    Birdi, Davin
    Smythe, Shannon
    Shekhar, Sudip
    Cheung, Karen C.
    Chrostowski, Lukas
    OPTICS EXPRESS, 2024, 32 (03) : 3085 - 3099
  • [49] An on-chip sensor to measure and compensate static NBTI-induced degradation in analog circuits
    Askari, Syed
    Nourani, Mehrdad
    MICROELECTRONICS RELIABILITY, 2013, 53 (02) : 245 - 253
  • [50] An on-chip concurrent high frequency analog and digital sinusoidal signal generator
    Ting, HW
    Liu, BD
    Chang, SJ
    PROCEEDINGS OF THE 2004 IEEE ASIA-PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS, VOL 1 AND 2: SOC DESIGN FOR UBIQUITOUS INFORMATION TECHNOLOGY, 2004, : 173 - 176
12345