Silicon odometer: An on-chip reliability monitor for measuring frequency degradation of digital circuits

被引：29
|
作者：
Kim, Tae-Hyoung [1 ]
Persaud, Randy [1 ]
Kim, Chris H. [1 ]
机构：
[1] Univ Minnesota, Dept ECE, Minneapolis, MN 55455 USA
来源：
2007 Symposium on VLSI Circuits, Digest of Technical Papers | 2007年
关键词：
D O I：
10.1109/VLSIC.2007.4342682
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A fully-digital reliability monitor is presented for high resolution frequency degradation measurements of digital circuits. The proposed scheme measures the beat frequency of two ring oscillators, one which is stressed and the other which is unstressed, to achieve 50X higher delay sensing resolution compared to prior techniques. A reliability monitor test chip has been fabricated in a 1.2V, 130nm CMOS technology.
引用
收藏
页码：122 / 123
页数：2
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