Enough test with DFT-focused chip testers

被引：0

作者：

Muhmenthaler, P ^{[1
]}

机构：

[1] Infineon Technol AG, D-81541 Munich, Germany

来源：

关键词：

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

引用

页码：1122 / 1122

页数：1

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