Enough test with DFT-focused chip testers

被引：0
|
作者：
Muhmenthaler, P [1 ]
机构：
[1] Infineon Technol AG, D-81541 Munich, Germany
来源：
INTERNATIONAL TEST CONFERENCE 2000, PROCEEDINGS | 2000年
关键词：
D O I：
暂无
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
引用
收藏
页码：1122 / 1122
页数：1
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