Enough test with DFT-focused chip testers

被引:0
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作者
Muhmenthaler, P [1 ]
机构
[1] Infineon Technol AG, D-81541 Munich, Germany
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中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
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页码:1122 / 1122
页数:1
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