VLSI TESTERS HELP GUARANTEE CHIP QUALITY

被引：0

作者：

KLINE, S

机构：

[1] Megatest Corp, San Jose, CA, USA, Megatest Corp, San Jose, CA, USA

来源：

ELECTRONICSWEEK | 1984年 / 57卷 / 29期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：63 / 66

页数：4

共 50 条

[1] TESTERS RISE TO VLSI CHALLENGE
MARSHALL, M
ELECTRONICS, 1980, 53 (24): : 89 - 90
[2] Sensors help guarantee quality of Gillette shavers
不详
INSIGHT, 2006, 48 (09) : 522 - 522
[3] Sensors help guarantee quality of Gillette shavers
不详
SENSOR REVIEW, 2007, 27 (01) : 62 - 62
[4] VLSI/LSI TESTERS - SPEED IS PRIMARY
OHR, S
ELECTRONIC DESIGN, 1983, 31 (03) : 71 - &
[5] VLSI TESTERS OFFER NEW ALTERNATIVES
NOVELLINO, J
ELECTRONIC DESIGN, 1989, 37 (18) : 25 - &
[6] INTEGRATED PIN ELECTRONICS FOR VLSI FUNCTIONAL TESTERS
GASBARRO, JA
HOROWITZ, MA
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1989, 24 (02) : 331 - 337
[7] VLSI chip design
Huang, LG
Chen, XD
Xia, WY
Zhu, YJ
Pan, BF
Li, J
Wang, YH
1996 2ND INTERNATIONAL CONFERENCE ON ASIC, PROCEEDINGS, 1996, : 348 - 351
[8] THE TINMANN VLSI CHIP
MELTON, MS
PHAN, T
REEVES, DS
VANDENBOUT, DE
IEEE TRANSACTIONS ON NEURAL NETWORKS, 1992, 3 (03): : 375 - 384
[9] CHIP TESTERS AUTOMATE TEST PROGRAM GENERATION
MCLEOD, J
ELECTRONICS-US, 1993, 66 (14): : 5 - 5
[10] Testing high speed VLSI devices using slower testers
Cheng, AKKT
Chakradhar, ST
17TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1999, : 16 - 21