VLSI TESTERS HELP GUARANTEE CHIP QUALITY

被引：0
|
作者：
KLINE, S
机构：
[1] Megatest Corp, San Jose, CA, USA, Megatest Corp, San Jose, CA, USA
来源：
ELECTRONICSWEEK | 1984年 / 57卷 / 29期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：63 / 66
页数：4
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