High performance ATE in a world with "DFT" testers

被引：0
|
作者：
Mandl, K [1 ]
机构：
[1] Teradyne Inc, Boston, MA 02118 USA
来源：
INTERNATIONAL TEST CONFERENCE 2000, PROCEEDINGS | 2000年
关键词：
D O I：
暂无
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
引用
收藏
页码：1140 / 1140
页数：1
相关论文
共 50 条
  • [1] DFT for testing high-performance pipelined circuits with slow-speed testers
    Nummer, M
    Sachdev, M
    DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS, 2003, : 212 - 217
  • [2] A common ground between DFT-based and performance testers
    Posse, K
    INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS, 2001, : 1155 - 1155
  • [3] Using device ATE testers to solve system anomalies
    Swail, J
    2002 IEEE AUTOTESTCON PROCEEEDINGS, SYSTEMS READINESS TECHNOLOGY CONFERENCE, 2002, : 650 - 660
  • [4] DFT时代的ATE结构——多端口ATE
    Masaharu Goto
    Klaus-Dieter Hilliges
    半导体技术, 2003, (06) : 41 - 43
  • [5] Position statement: DFT focused testers
    Crouch, AL
    INTERNATIONAL TEST CONFERENCE 2000, PROCEEDINGS, 2000, : 1121 - 1121
  • [6] A DFT Technique for Testing High-Speed Circuits with Arbitrarily Slow Testers
    Muhammad Nummer
    Manoj Sachdev
    Journal of Electronic Testing, 2003, 19 : 299 - 314
  • [7] A DFT technique for testing high-speed circuits with arbitrarily slow testers
    Nummer, M
    Sachdev, M
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2003, 19 (03): : 299 - 314
  • [8] Benefits of SiGe for high-performance ATE
    Rodriguez, CW
    EE-EVALUATION ENGINEERING, 2000, 39 (06): : 21 - 21
  • [9] ATE VENDORS TIGHTEN DFT LINK
    MENDELSOHN, A
    COMPUTER DESIGN, 1990, 29 (22): : 1 - &
  • [10] Multicore Programming Techniques for High-Performance ATE
    Ravindran, Murali
    Meisel, Jeff
    IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, 2009, 12 (04) : 26 - 29
12345