ESD protection for sub-45 nm MugFET technology

被引：0

作者：

Natarajan, M. I. ^{[1
]}

Thijs, S. ^{[2
]}

Trmouilles, D. ^{[3
]}

Linten, D. ^{[4
]}

Collaert, N. ^{[4
]}

Jurczak, M. ^{[4
]}

Groeseneken, G. ^{[2
]}

机构：

[1] SILTERRA MALAYSIA SDN BHD, Kulim Hi Tech Pk, Kulim 09000, Malaysia

[2] Katholieke Univ Leuven, Dept Elect Engn, Leuven, Belgium

[3] CNRS, ISGE, LAAS, F-31077 Toulouse, France

[4] IMEC VZW, B-3001 Louvain, Belgium

来源：

IPFA 2007: PROCEEDINGS OF THE 14TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS | 2007年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：159 / +

页数：2

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