ESD protection for sub-45 nm MugFET technology

被引：0
|
作者：
Natarajan, M. I. [1 ]
Thijs, S. [2 ]
Trmouilles, D. [3 ]
Linten, D. [4 ]
Collaert, N. [4 ]
Jurczak, M. [4 ]
Groeseneken, G. [2 ]
机构：
[1] SILTERRA MALAYSIA SDN BHD, Kulim Hi Tech Pk, Kulim 09000, Malaysia
[2] Katholieke Univ Leuven, Dept Elect Engn, Leuven, Belgium
[3] CNRS, ISGE, LAAS, F-31077 Toulouse, France
[4] IMEC VZW, B-3001 Louvain, Belgium
来源：
IPFA 2007: PROCEEDINGS OF THE 14TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS | 2007年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：159 / +
页数：2
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