Timing Verification of a 45nm SOI Standard Cell Library

被引：0
|
作者：
Pelloie, Jean-Luc [1 ]
Laplanche, Yves [1 ]
Hawkins, Chris [1 ]
Kundu, Roma [1 ]
机构：
[1] ARM, F-38000 Grenoble, France
来源：
2010 IEEE INTERNATIONAL SOI CONFERENCE | 2010年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页数：2
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