A Transient Fault Tolerant Test Pattern Generator for On-line Built-in Self-test

被引：0

作者：

Fukazawa, Yuki ^{[1
]}

Iwagaki, Tsuyoshi ^{[1
]}

Ichihara, Hideyuki ^{[1
]}

Inoue, Tomoo ^{[1
]}

机构：

[1] Hiroshima City Univ, Grad Sch Informat Sci, Asaminami Ku, Hiroshima 7313194, Japan

来源：

2013 22ND ASIAN TEST SYMPOSIUM (ATS) | 2013年

关键词：

Fault tolerance; test pattern generators; test-reliability; cyclic code; on-line BIST; real-time application; YIELD;

D O I：

10.1109/ATS.2013.24

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Reliable built-in self-test (Reliable BIST) is a scheme in which embedded circuits used for self-testing circuits-under-test (CUTs) are designed to be tolerant of their faults. Reliable BIST is especially important for highly reliable on-line testing for real-time system; reliable BIST is required to recover itself from transient errors of its embedded BIST circuits. In this paper, we propose a transient fault tolerant test pattern generator (TPG) for a reliable BIST scheme. The proposed TPG, called EC-TPG, can correct (or mask) errors that occur on itself during testing CUTs, so that it can enhance its test-reliability, which is the probability that the TPG can generate correct (expected) test patterns. We analyze the test-reliability of EC-TPG in order to show that EC-TPG has high test-reliability. Furthermore we demonstrate that, in on-line BIST for real-time systems, EC-TPG can achieve higher test-reliability compared with a test re-execution scheme with error detection through some case studies.

引用

页码：85 / 90

页数：6

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