A Transient Fault Tolerant Test Pattern Generator for On-line Built-in Self-test

被引：0
|
作者：
Fukazawa, Yuki [1 ]
Iwagaki, Tsuyoshi [1 ]
Ichihara, Hideyuki [1 ]
Inoue, Tomoo [1 ]
机构：
[1] Hiroshima City Univ, Grad Sch Informat Sci, Asaminami Ku, Hiroshima 7313194, Japan
来源：
2013 22ND ASIAN TEST SYMPOSIUM (ATS) | 2013年
关键词：
Fault tolerance; test pattern generators; test-reliability; cyclic code; on-line BIST; real-time application; YIELD;
D O I：
10.1109/ATS.2013.24
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Reliable built-in self-test (Reliable BIST) is a scheme in which embedded circuits used for self-testing circuits-under-test (CUTs) are designed to be tolerant of their faults. Reliable BIST is especially important for highly reliable on-line testing for real-time system; reliable BIST is required to recover itself from transient errors of its embedded BIST circuits. In this paper, we propose a transient fault tolerant test pattern generator (TPG) for a reliable BIST scheme. The proposed TPG, called EC-TPG, can correct (or mask) errors that occur on itself during testing CUTs, so that it can enhance its test-reliability, which is the probability that the TPG can generate correct (expected) test patterns. We analyze the test-reliability of EC-TPG in order to show that EC-TPG has high test-reliability. Furthermore we demonstrate that, in on-line BIST for real-time systems, EC-TPG can achieve higher test-reliability compared with a test re-execution scheme with error detection through some case studies.
引用
收藏
页码：85 / 90
页数：6
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