HIGH RESOLUTION X-RAY MICRO-CT OF ULTRA-THIN WALL SPACE COMPONENTS

被引：0
|
作者：
Roth, D. J. [1 ]
Rauser, R. W. [2 ]
Bowman, R. R. [1 ]
Bonacuse, P. J. [1 ]
Martin, R. E. [3 ]
Locci, I. E. [2 ]
Kelley, M. [4 ]
机构：
[1] NASA, Glenn Res Ctr, Cleveland, OH 44135 USA
[2] Univ Toledo, Toledo, OH 43606 USA
[3] Cleveland State Univ, Cleveland, OH 44115 USA
[4] NEURAL ID, Redwood City, CA 94065 USA
来源：
REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 32A AND 32B | 2013年 / 1511卷
关键词：
Nondestructive Evaluation (NDE); Computed Tomography; Imaging; X-ray Metallic Components; Thin Wall Inspection;
D O I：
10.1063/1.14789101
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
A high resolution micro-CT system has been assembled and is being used to provide optimal characterization for ultra-thin wall space components. The Glenn Research Center NDE Sciences Team, using this CT system, has assumed the role of inspection vendor for the Advanced Stirling Convertor (ASC) project at NASA. This article will discuss many aspects of the development of the CT scanning for this type of component, including CT system overview; inspection requirements; process development, software utilized and developed to visualize, process, and analyze results; calibration sample development; results on actual samples; correlation with optical/SEM characterization; CT modeling; and development of automatic flaw recognition software.
引用
收藏
页码：595 / 603
页数：9
相关论文
共 50 条
  • [31] High resolution X-ray micro-CT imaging of fibrin scaffold using large area single photon counting detector
    Vavrik, D.
    Kytyr, D.
    Muehleder, S.
    Vopalensky, M.
    Benes, P.
    Pichotka, M.
    Kumpova, I
    Koudelka, P.
    JOURNAL OF INSTRUMENTATION, 2018, 13
  • [32] Characterization and analysis of alumina clusters in steel by X-ray Micro-CT
    Zhao, Yi
    Ju, Liying
    Guo, Xiaopei
    Li, Tao
    Tan, Min
    Guo, Han
    Gu, Shaopeng
    JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T, 2023, 24 : 3252 - 3264
  • [33] Development of 36M-pixel x-ray detector for large field of view and high-resolution micro-CT
    Umetani, Keiji
    Kawata, Yoshiki
    Niki, Noboru
    OPTOELECTRONIC IMAGING AND MULTIMEDIA TECHNOLOGY IV, 2016, 10020
  • [34] X-ray Micro-CT: How Soil Pore Space Description Can Be Altered by Image Processing
    Smet, Sarah
    Plougonven, Erwan
    Leonard, Angelique
    Degre, Aurore
    Beckers, Eleonore
    VADOSE ZONE JOURNAL, 2018, 17 (01)
  • [35] Design and characterization of high energy micro-CT with a laser-based X-ray source
    Yang, Yue
    Wu, Yu-Chi
    Li, Liang
    Zhang, Si-Yuan
    Dong, Ke-Gong
    Zhang, Tian-Kui
    Yu, Ming-Hai
    Zhang, Xiao-Hui
    Zhu, Bin
    Tan, Fang
    Yan, Yong-Hong
    Li, Gang
    Fan, Wei
    Lu, Feng
    Zhao, Zong-Qing
    Zhou, Wei-Min
    Cao, Lei-Feng
    Gu, Yu-Qiu
    RESULTS IN PHYSICS, 2019, 14
  • [36] Effect of experimental parameters on X-ray Micro-CT imaging for Spectral CT applications
    Lima, Mateus Gruener
    Jussiani, Eduardo Inocente
    RADIATION PHYSICS AND CHEMISTRY, 2025, 226
  • [37] Performance and Properties of Ultra-Thin Silicon Nitride X-ray Windows
    Torma, Pekka T.
    Kostamo, Jari
    Sipila, Heikki
    Mattila, Marco
    Kostamo, Pasi
    Kostamo, Esa
    Lipsanen, Harri
    Laubis, Christian
    Scholze, Frank
    Nelms, Nick
    Shortt, Brian
    Bavdaz, Marcos
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2014, 61 (01) : 695 - 699
  • [38] An X-ray photoelectron spectroscopy study of ultra-thin oxynitride films
    Ladas, S.
    Sygellou, L.
    Kennou, S.
    Wolf, M.
    Roeder, G.
    Nutsch, A.
    Rambach, M.
    Lerch, W.
    THIN SOLID FILMS, 2011, 520 (02) : 871 - 875
  • [39] X-ray studies of ultra-thin Si wafers for mirror application
    Sass, J.
    Mazur, K.
    Surma, B.
    Eichhorn, F.
    Litwin, D.
    Galas, J.
    Sitarek, S.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, 253 (1-2): : 236 - 240
  • [40] Ultra-thin freestanding diamond window for soft X-ray optics
    Ying, XT
    Luo, JL
    Wang, PN
    Cui, MQ
    Zhao, YD
    Li, G
    Zhu, PP
    DIAMOND AND RELATED MATERIALS, 2003, 12 (3-7) : 719 - 722
12345