HIGH RESOLUTION X-RAY MICRO-CT OF ULTRA-THIN WALL SPACE COMPONENTS

被引：0
|
作者：
Roth, D. J. [1 ]
Rauser, R. W. [2 ]
Bowman, R. R. [1 ]
Bonacuse, P. J. [1 ]
Martin, R. E. [3 ]
Locci, I. E. [2 ]
Kelley, M. [4 ]
机构：
[1] NASA, Glenn Res Ctr, Cleveland, OH 44135 USA
[2] Univ Toledo, Toledo, OH 43606 USA
[3] Cleveland State Univ, Cleveland, OH 44115 USA
[4] NEURAL ID, Redwood City, CA 94065 USA
来源：
REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 32A AND 32B | 2013年 / 1511卷
关键词：
Nondestructive Evaluation (NDE); Computed Tomography; Imaging; X-ray Metallic Components; Thin Wall Inspection;
D O I：
10.1063/1.14789101
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
A high resolution micro-CT system has been assembled and is being used to provide optimal characterization for ultra-thin wall space components. The Glenn Research Center NDE Sciences Team, using this CT system, has assumed the role of inspection vendor for the Advanced Stirling Convertor (ASC) project at NASA. This article will discuss many aspects of the development of the CT scanning for this type of component, including CT system overview; inspection requirements; process development, software utilized and developed to visualize, process, and analyze results; calibration sample development; results on actual samples; correlation with optical/SEM characterization; CT modeling; and development of automatic flaw recognition software.
引用
收藏
页码：595 / 603
页数：9
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