Scanning tunneling microscopy studies of fullerenes

被引：0

作者：

Sakurai, T. ^{[1
]}

Wang, X.-D. ^{[1
,2
]}

Hashizume, T. ^{[1
,3
]}

机构：

[1] Institute for Materials Research, Tohoku University, Sendai 980, Japan

[2] Department of Physics, University of Texas-Austin, Austin, TX 78712, United States

[3] Advanced Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-03, Japan

来源：

Materials Science Forum | 1996年 / 232卷

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：119 / 154

共 50 条

[41] SCANNING TUNNELING MICROSCOPY
VANDELEEMPUT, LEC
VANKEMPEN, H
REPORTS ON PROGRESS IN PHYSICS, 1992, 55 (08) : 1165 - 1240
[42] SCANNING TUNNELING MICROSCOPY
STOLL, E
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1984, 9 (03): : 213 - 216
[43] SCANNING TUNNELING MICROSCOPY
NISHIKAWA, O
JOURNAL OF ELECTRON MICROSCOPY, 1988, 37 (02): : 92 - 93
[44] SCANNING TUNNELING MICROSCOPY
BINNIG, G
ROHRER, H
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (04) : 355 - 369
[45] SCANNING TUNNELING MICROSCOPY
CHIANG, S
WILSON, RJ
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1987, 193 : 10 - ANYL
[46] SCANNING TUNNELING MICROSCOPY
BINNIG, G
ROHRER, H
HELVETICA PHYSICA ACTA, 1982, 55 (06): : 726 - 735
[47] SCANNING TUNNELING MICROSCOPY
BINNIG, G
ROHRER, H
PHYSICA B & C, 1984, 127 (1-3): : 37 - 45
[48] SCANNING TUNNELING MICROSCOPY
EDELMAN, VS
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1989, 32 (05) : 993 - 1022
[49] SCANNING TUNNELING MICROSCOPY
GRIFFITH, JE
KOCHANSKI, GP
ANNUAL REVIEW OF MATERIALS SCIENCE, 1990, 20 : 219 - 244
[50] COMPLEMENTARY SCANNING TUNNELING MICROSCOPY AND SCANNING ELECTRON-MICROSCOPY STUDIES OF ELECTROPLATED GOLD SURFACES
SIPERKO, LM
HURBAN, SS
SPALIK, JM
KATNANI, AD
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (04): : 2400 - 2403