Scanning tunneling microscopy studies of fullerenes

被引：0
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作者：
Sakurai, T. [1 ]
Wang, X.-D. [1 ,2 ]
Hashizume, T. [1 ,3 ]
机构：
[1] Institute for Materials Research, Tohoku University, Sendai 980, Japan
[2] Department of Physics, University of Texas-Austin, Austin, TX 78712, United States
[3] Advanced Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-03, Japan
来源：
Materials Science Forum | 1996年 / 232卷
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页码：119 / 154
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