Scanning tunneling microscopy studies of fullerenes

被引：0

|

作者：

Sakurai, T. ^{[1
]}

Wang, X.-D. ^{[1
,2
]}

Hashizume, T. ^{[1
,3
]}

机构：

[1] Institute for Materials Research, Tohoku University, Sendai 980, Japan

[2] Department of Physics, University of Texas-Austin, Austin, TX 78712, United States

[3] Advanced Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-03, Japan

来源：

Materials Science Forum | 1996年 / 232卷

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页码：119 / 154

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