SCANNING TUNNELING MICROSCOPY

被引：0

|

作者：

NISHIKAWA, O ^{[1
]}

机构：

[1] TOKYO INST TECHNOL,GRAD SCH NAGATSUTA,DEPT MAT SCI ENGN,YOKOHAMA,KANAGAWA 227,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1988年 / 37卷 / 02期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：92 / 93

页数：2

相关论文

共 50 条

[1] SCANNING TUNNELING MICROSCOPY
ROHRER, H
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 1987, 84 (14) : 4666 - 4666
[2] SCANNING TUNNELING MICROSCOPY
ELINGS, V
AMERICAN LABORATORY, 1988, 20 (04) : 124 - 124
[3] SCANNING TUNNELING MICROSCOPY
不详
ELECTRO-OPTICS, 1983, 15 (06): : 24 - &
[4] SCANNING TUNNELING MICROSCOPY
BINNIG, G
ROHRER, H
HELVETICA PHYSICA ACTA, 1983, 56 (1-3): : 481 - 482
[5] SCANNING TUNNELING MICROSCOPY
BINNIG, G
ROHRER, H
SURFACE SCIENCE, 1983, 126 (1-3) : 236 - 244
[6] SCANNING TUNNELING MICROSCOPY
BINNIG, G
ROHRER, H
SURFACE SCIENCE, 1985, 152 (APR) : 17 - 26
[7] SCANNING TUNNELING MICROSCOPY
SHEN, J
PRITCHARD, RG
THURSTANS, RE
CONTEMPORARY PHYSICS, 1991, 32 (01) : 11 - 20
[8] SCANNING TUNNELING MICROSCOPY
SAKURAI, T
SAKAI, A
DENKI KAGAKU, 1988, 56 (08): : 601 - 607
[9] SCANNING TUNNELING MICROSCOPY
VANDELEEMPUT, LEC
VANKEMPEN, H
REPORTS ON PROGRESS IN PHYSICS, 1992, 55 (08) : 1165 - 1240
[10] SCANNING TUNNELING MICROSCOPY
HANSMA, PK
TERSOFF, J
JOURNAL OF APPLIED PHYSICS, 1987, 61 (02) : R1 - R23

← 1 2 3 4 5 →