New procedures for identifying undetectable and redundant faults in synchronous sequential circuits

被引：0
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作者：
Reddy, Sudhakar M. [1 ]
Pomeranz, Irith [1 ]
Lin, Xijiang [1 ]
Basturkmen, Nadir Z. [1 ]
机构：
[1] Univ of Iowa, Iowa City, United States
来源：
Proceedings of the IEEE VLSI Test Symposium | 1999年
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页码：275 / 281
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