New procedures for identifying undetectable and redundant faults in synchronous sequential circuits

被引：0
|
作者：
Reddy, Sudhakar M. [1 ]
Pomeranz, Irith [1 ]
Lin, Xijiang [1 ]
Basturkmen, Nadir Z. [1 ]
机构：
[1] Univ of Iowa, Iowa City, United States
来源：
Proceedings of the IEEE VLSI Test Symposium | 1999年
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：275 / 281
相关论文
共 50 条
  • [21] An algorithmic test generation method for crosstalk faults in synchronous sequential circuits
    Itazaki, N
    Matsumoto, Y
    Kinoshita, K
    SIXTH ASIAN TEST SYMPOSIUM (ATS'97), PROCEEDINGS, 1997, : 22 - 27
  • [22] New procedures to identify redundant stuck-at faults and removal of redundant logic
    Chen, G
    Reddy, S
    Porneranz, I
    Rajski, J
    19TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS, 2005, : 419 - 424
  • [23] IDENTIFICATION OF UNDETECTABLE FAULTS IN COMBINATIONAL-CIRCUITS
    HARIHARA, M
    MENON, PR
    PROCEEDINGS - IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN : VLSI IN COMPUTERS & PROCESSORS, 1989, : 290 - 293
  • [24] Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints
    Taavi Viilukas
    Anton Karputkin
    Jaan Raik
    Maksim Jenihhin
    Raimund Ubar
    Hideo Fujiwara
    Journal of Electronic Testing, 2012, 28 : 511 - 521
  • [25] Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints
    Viilukas, Taavi
    Karputkin, Anton
    Raik, Jaan
    Jenihhin, Maksim
    Ubar, Raimund
    Fujiwara, Hideo
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2012, 28 (04): : 511 - 521
  • [26] COMBINATIONAL ATPG THEOREMS FOR IDENTIFYING UNTESTABLE FAULTS IN SEQUENTIAL-CIRCUITS
    AGRAWAL, VD
    CHAKRADHAR, ST
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1995, 14 (09) : 1155 - 1160
  • [27] Identification of Redundant Faults in Combinational Circuits
    Minamiyama, Tetsuro
    Takamatsu, Yuzo
    Systems and Computers in Japan, 2000, 31 (06) : 65 - 72
  • [28] A method for reducing the target fault list of crosstalk faults in synchronous sequential circuits
    Takahashi, H
    Keller, KJ
    Le, KT
    Saluja, KK
    Takamatsu, Y
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2005, 24 (02) : 252 - 263
  • [29] ANALYZING MULTIPLE FAULTS IN SYNCHRONOUS SEQUENTIAL-CIRCUITS BY BOOLEAN DIFFERENCE TECHNIQUES
    DAS, SR
    NAYAK, AR
    NGUYEN, T
    CYBERNETICS AND SYSTEMS, 1990, 21 (04) : 461 - 474
  • [30] ANALYTICAL APPROACH OF UNDETECTABLE BRIDGING FAULTS IN COMBINATIONAL CIRCUITS
    Bucur, I. I.
    UNIVERSITY POLITEHNICA OF BUCHAREST SCIENTIFIC BULLETIN SERIES C-ELECTRICAL ENGINEERING AND COMPUTER SCIENCE, 2006, 68 (03): : 63 - 74
12345