New procedures for identifying undetectable and redundant faults in synchronous sequential circuits

被引：0

作者：

Reddy, Sudhakar M. ^{[1
]}

Pomeranz, Irith ^{[1
]}

Lin, Xijiang ^{[1
]}

Basturkmen, Nadir Z. ^{[1
]}

机构：

[1] Univ of Iowa, Iowa City, United States

来源：

Proceedings of the IEEE VLSI Test Symposium | 1999年

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：275 / 281

共 50 条

[1] New procedures for identifying undetectable and redundant faults in synchronous sequential circuits
Reddy, SM
Pomeranz, I
Lin, XJ
Basturkmen, NZ
17TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1999, : 275 - 281
[2] On finding undetectable and redundant faults in synchronous sequential circuits
Lin, XJ
Pomeranz, I
Reddy, SM
INTERNATIONAL CONFERENCE ON COMPUTER DESIGN: VLSI IN COMPUTERS AND PROCESSORS, PROCEEDINGS, 1998, : 498 - 503
[3] Procedures for identifying untestable and redundant transition faults in synchronous sequential circuits
Chen, G
Reddy, SA
Pomeranz, I
21ST INTERNATIONAL CONFERENCE ON COMPUTER DESIGN, PROCEEDINGS, 2003, : 36 - 41
[4] On removing redundant faults in synchronous sequential circuits
Lin, XJ
Pomeranz, I
Reddy, SM
16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1998, : 168 - 175
[5] On redundant path delay faults in synchronous sequential circuits
Tekumalla, RC
Menon, PR
IEEE TRANSACTIONS ON COMPUTERS, 2000, 49 (03) : 277 - 282
[6] On masking of redundant faults in synchronous sequential circuits with design-for-testability logic
Pomeranz, I
Reddy, SM
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2005, 24 (02) : 288 - 294
[7] On application of output masking to undetectable faults in synchronous sequential circuits with design-for-testability logic
Pomeranz, I
Reddy, SM
ICCAD-2003: IEEE/ACM DIGEST OF TECHNICAL PAPERS, 2003, : 867 - 872
[8] On generating tests that avoid the detection of redundant faults in synchronous sequential circuits with full scan
Pomeranz, I
Reddy, SM
IEEE TRANSACTIONS ON COMPUTERS, 2006, 55 (04) : 491 - 495
[9] Theorems for identifying undetectable faults in partial-scan circuits
Pomeranz, I
Reddy, SM
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2003, 22 (08) : 1092 - 1097
[10] On the detection of reset faults in synchronous sequential circuits
Pomeranz, I
Reddy, SM
TENTH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS, 1997, : 470 - 474

← 1 2 3 4 5 →