A bent Laue analyzer for fluorescence EXAFS detection

被引：0
|
作者：
Zhong, Zhong
Chapman, Dean
Bunker, Bruce
Bunker, Grant
Fischetti, Robert
Segre, Carlo
机构：
[1] NSLS, Brookhaven National Laboratory, Upton, NY 11973, United States
[2] CSRRI, Illinois Institute of Technology, Chicago, IL 60616, United States
[3] Physics Dept., Univ. of Notre Dame, Notre Dame, IN 46556, United States
[4] BioCAT Project, Illinois Institute of Technology, Chicago, IL 60616, United States
[5] BCPS Dept., Illinois Institute of Technology, Chicago, IL 60616, United States
来源：
Journal of Synchrotron Radiation | 1999年 / 6卷 / 03期
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页码：212 / 214
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