Realistic yield-evaluation of fault-tolerant programmable logic arrays

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作者：
Battaglini, Gianluca [1 ]
Ciciani, Bruno [1 ]
机构：
[1] Univ of Rome `La Sapienza', Rome, Italy
来源：
IEEE Transactions on Reliability | 1998年 / 47卷 / 3 pt 1期
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页码：212 / 224
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