Realistic yield-evaluation of fault-tolerant programmable logic arrays

被引：0

作者：

Battaglini, Gianluca ^{[1
]}

Ciciani, Bruno ^{[1
]}

机构：

[1] Univ of Rome `La Sapienza', Rome, Italy

来源：

IEEE Transactions on Reliability | 1998年 / 47卷 / 3 pt 1期

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摘要：

引用

页码：212 / 224

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