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- [2] Room-Temperature Chip-Stack Interconnection Using Compliant Bumps and Wedge-Incorporated Electrodes 2010 PROCEEDINGS 60TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2010, : 1763 - 1768
- [3] Pyramid bumps for fine-pitch chip-stack interconnection JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (4B): : 2751 - 2755
- [4] Chip-to-chip interconnection by mechanical caulking using reflowed Sn bumps ICEPT: 2007 8TH INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING TECHNOLOGY, PROCEEDINGS, 2007, : 81 - +
- [5] Pyramid bumps for fine-pitch chip-stack interconnection Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2005, 44 (4 B): : 2751 - 2755
- [6] Low-temperature high-density chip-stack interconnection using compliant bump 57TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2007 PROCEEDINGS, 2007, : 622 - +
- [8] Low-Resistance Room-Temperature Interconnection Technique for Bonding Fine Pitch Bumps Journal of Materials Engineering and Performance, 2021, 30 : 3173 - 3177
- [9] HIGH-DENSITY ROOM-TEMPERATURE 3D CHIP-STACKING USING MECHANICAL CAULKING WITH COMPLIANT BUMP AND THROUGH-HOLE-ELECTRODE IPACK 2009: PROCEEDINGS OF THE ASME INTERPACK CONFERENCE 2009, VOL 1, 2010, : 33 - 38
- [10] The effect of bonding conditions on the electrical properties of solder joints fabricated by mechanical caulking using reflowed Sn bumps 2007 INTERNATIONAL CONFERENCE ON ELECTRONIC MATERIALS AND PACKAGING, 2007, : 189 - +