LINEAR VARIATIONS IN CONDUCTIVITY WITH THICKNESS OF THIN POLYCRYSTALLINE FILMS

被引:23
|
作者
PICHARD, CR
TELLIER, CR
TOSSER, AJ
机构
关键词
D O I
10.1007/BF00552312
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:2236 / 2240
页数:5
相关论文
共 50 条
  • [41] On the thickness dependence of the electrical conductivity and energy gap in semiconducting thin films
    Gîrtan, M
    Rusu, GI
    PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 2002, 3-4 : 117 - 126
  • [42] Comparative Analysis of the Thickness and Electrical Conductivity of Thin Chalcogenide Semiconductor Films
    Dan'shina, V. V.
    Kalistratova, L. F.
    PHYSICS OF THE SOLID STATE, 2017, 59 (01) : 180 - 183
  • [43] LINEAR EVAPORATOR FOR PRODUCTION OF THIN-FILMS OF UNIFORM THICKNESS
    SCHILLER, S
    GOEDICKE, K
    VAKUUM-TECHNIK, 1973, 22 (05): : 149 - 149
  • [44] NON-LINEAR CONDUCTIVITY OF THIN SEMICONDUCTOR-FILMS
    ROMANOV, YA
    DEMIDOV, EV
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1980, 14 (08): : 906 - 908
  • [45] INTERFERENCE METHOD FOR MEASUREMENT OF THICKNESS VARIATIONS IN THIN LIQUID-FILMS
    FISHER, LR
    PARKER, NS
    SHARPLES, F
    OPTICAL ENGINEERING, 1980, 19 (06) : 798 - 800
  • [46] RESIDUAL CONDUCTIVITY OF POLYCRYSTALLINE PBSE FILMS
    VARFOLOMEEV, SP
    PASHKEVICH, AV
    SHELEKHIN, YL
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1985, 19 (03): : 335 - 336
  • [47] Hopping conductivity in polycrystalline diamond films
    P. G. Kopylov
    A. M. Lotonov
    I. A. Apolonskaya
    A. N. Obraztsov
    Moscow University Physics Bulletin, 2009, 64 : 161 - 165
  • [48] Hopping conductivity in polycrystalline diamond films
    Kopylov, P. G.
    Lotonov, A. M.
    Apolonskaya, I. A.
    Obraztsov, A. N.
    MOSCOW UNIVERSITY PHYSICS BULLETIN, 2009, 64 (02) : 161 - 165
  • [49] The electrical conductivity of polycrystalline metallic films
    Moraga, Luis
    Arenas, Claudio
    Henriquez, Ricardo
    Bravo, Sergio
    Solis, Basilio
    PHYSICA B-CONDENSED MATTER, 2016, 499 : 17 - 23
  • [50] Thickness determination of thin polycrystalline films by grazing incidence X-ray diffraction
    Lhotka, J
    Kuzel, R
    Cappuccio, G
    Valvoda, V
    EUROPEAN POWDER DIFFRACTION EPDIC 8, 2004, 443-4 : 115 - 118