INTERFERENCE METHOD FOR MEASUREMENT OF THICKNESS VARIATIONS IN THIN LIQUID-FILMS

被引：6

作者：

FISHER, LR ^{[1
]}

PARKER, NS ^{[1
]}

SHARPLES, F ^{[1
]}

机构：

[1] CSIRO, DIV APPL PHYS, SYDNEY, NSW 2070, AUSTRALIA

来源：

OPTICAL ENGINEERING | 1980年 / 19卷 / 06期

关键词：

Compendex;

D O I：

10.1117/12.7972613

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

INTERFEROMETRY

引用

页码：798 / 800

页数：3

共 50 条

[1] THICKNESS MEASUREMENT OF THIN LIQUID-FILMS ON INACCESSIBLE SURFACES
PATEL, PD
SMALL, J
INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1978, 16 (11) : 978 - 982
[2] CRITICAL THICKNESS OF THIN FREE LIQUID-FILMS
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COLLOID AND POLYMER SCIENCE, 1978, 256 (08) : 804 - 813
[3] MEASUREMENT OF THIN LIQUID-FILMS BY A FLUORESCENCE TECHNIQUE
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[4] CRITICAL THICKNESS OF THIN LIQUID-FILMS - THEORY AND EXPERIMENT
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[5] THIN LIQUID-FILMS
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[6] MEASUREMENT OF MASSTRANSFER COEFFICIENTS OF THIN EVAPORATING LIQUID-FILMS
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[7] APPLICATION OF ULTRASONICS TO THE MEASUREMENT OF THIN FLOWING LIQUID-FILMS
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[8] AN ALGORITHM FOR THE CALCULATION OF THE THICKNESS OF THIN LIQUID-FILMS IN LANGMUIR-BLODGETT (LB) LAYERS IN INTERFERENCE MEASUREMENTS
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[9] STABILITY OF THIN LIQUID-FILMS
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[10] INFLUENCE OF THE ALTERNATING-CURRENT FREQUENCY ON THE RESULTS OF MEASUREMENT OF THE THICKNESS OF LIQUID-FILMS BY THE CONDUCTIVITY METHOD
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