INTERFERENCE METHOD FOR MEASUREMENT OF THICKNESS VARIATIONS IN THIN LIQUID-FILMS

被引：6

作者：

FISHER, LR ^{[1
]}

PARKER, NS ^{[1
]}

SHARPLES, F ^{[1
]}

机构：

[1] CSIRO, DIV APPL PHYS, SYDNEY, NSW 2070, AUSTRALIA

来源：

OPTICAL ENGINEERING | 1980年 / 19卷 / 06期

关键词：

Compendex;

D O I：

10.1117/12.7972613

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

INTERFEROMETRY

引用

页码：798 / 800

页数：3

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