LINEAR VARIATIONS IN CONDUCTIVITY WITH THICKNESS OF THIN POLYCRYSTALLINE FILMS

被引：23
|
作者：
PICHARD, CR
TELLIER, CR
TOSSER, AJ
机构：
来源：
JOURNAL OF MATERIALS SCIENCE | 1980年 / 15卷 / 09期
关键词：
D O I：
10.1007/BF00552312
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：2236 / 2240
页数：5
相关论文
共 50 条
  • [21] REINTERPRETATION OF THICKNESS-DEPENDENT CONDUCTIVITY OF THIN PLATINUM FILMS
    MESSAADI, S
    PICHARD, C
    TOSSER, AJ
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1986, 5 (09) : 873 - 875
  • [22] Spatial thickness variations in laser-deposited thin films
    Singh, RK
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1997, 45 (1-3): : 180 - 185
  • [23] Spatial thickness variations in laser-deposited thin films
    Univ of Florida, Gainesville, United States
    Mater Sci Eng B Solid State Adv Technol, 1-3 (180-185):
  • [24] Variations in the thermal conductivity of insulating thin films with temperature and pressure
    Choi, SH
    Maruyama, S
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2004, 45 (04) : 897 - 906
  • [25] CONDUCTIVITY OF POLYCRYSTALLINE CDS FILMS
    DEPTUCH, A
    GRUS, M
    HORODECKI, AJ
    LEPEK, M
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 37 (01): : K101 - K104
  • [26] The thickness dependence of the flow stress of capped and uncapped polycrystalline Ag thin films
    Kobrinsky, MJ
    Thompson, CV
    APPLIED PHYSICS LETTERS, 1998, 73 (17) : 2429 - 2431
  • [27] Determination of the thickness of polycrystalline thin films by using X-ray methods
    Danis, S.
    Matej, Z.
    Matejova, L.
    Krupka, M.
    THIN SOLID FILMS, 2015, 591 : 215 - 218
  • [28] THICKNESS EFFECT ON HYDROGEN PLASMA TREATMENT ON POLYCRYSTALLINE SILICON THIN-FILMS
    LIOU, BW
    WU, YH
    LEE, CL
    LEI, TF
    APPLIED PHYSICS LETTERS, 1995, 66 (22) : 3013 - 3014
  • [29] Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline PZT thin films
    Araujo, E. B.
    Lima, E. C.
    Bdikin, I. K.
    Kholkin, A. L.
    2012 INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS HELD JOINTLY WITH 11TH IEEE ECAPD AND IEEE PFM (ISAF/ECAPD/PFM), 2012,
  • [30] Thickness effects in polycrystalline thin films: Surface constraint versus interior constraint
    Fan, Haidong
    Li, Zhenhuan
    Huang, Minsheng
    Zhang, Xiong
    INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, 2011, 48 (11-12) : 1754 - 1766
12345