共 50 条
- [21] NEGATIVE STAGE OF ANNEALING OF RADIATION DEFECTS IN N-TYPE SILICON SOVIET PHYSICS SEMICONDUCTORS-USSR, 1979, 13 (02): : 237 - 238
- [22] Analysis of piezoresistance in n-type 6H SiC for high-temperature mechanical sensors BOSTON TRANSDUCERS'03: DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2, 2003, : 758 - 761
- [25] Electrically active defects in n-type 4H- and 6H-SiC SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 : 565 - 568
- [26] Fabrication of low resistivity n-type 6H and 4H SiC substrates by the sublimation growth SILICON CARBIDE AND RELATED MATERIALS 1995, 1996, 142 : 65 - 68
- [27] PHOTOCONDUCTIVITY AND LUMINESCENCE OF THE 4H AND 6H POLYTYPES OF n-TYPE SiC DOPED WITH Sc. Soviet physics. Semiconductors, 1982, 16 (07): : 795 - 798
- [29] Metastable defects in low-energy electron irradiated n-type 4H-SiC SILICON CARBIDE AND RELATED MATERIALS 2009, PTS 1 AND 2, 2010, 645-648 : 435 - +
- [30] Bistable defects in low-energy electron irradiated n-type 4H-SiC PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2010, 4 (8-9): : 227 - 229