ANALYZING MULTIPLE FAULTS IN SYNCHRONOUS SEQUENTIAL-CIRCUITS BY BOOLEAN DIFFERENCE TECHNIQUES

被引：0

作者：

DAS, SR

NAYAK, AR

NGUYEN, T

机构：

[1] Department of Electrical Engineering, University of Ottawa, Ottawa, ON

[2] Department of Systems and Computer Engineering, Carleton University, Ottawa, ON

[3] Department of Electrical Engineering, University of Ottawa, Ottawa, ON

来源：

CYBERNETICS AND SYSTEMS | 1990年 / 21卷 / 04期

关键词：

D O I：

10.1080/01969729008902253

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The Boolean difference is a mathematical concept that has proved its usefulness in the study of single and multiple “stuck-at" faults in combinational circuits. Goldstein has extended his tool of analysis to cover the multiple stuck-at faults Asynchronous sequential circuits. In this paper, modifications to Goldstein's paper are presented, together with a new method for deriving the required shortest test sequence to detect a specified multiple fault. © 1990 Taylor & Francis Group, LLC.

引用

页码：461 / 474

页数：14

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