DIRECT STRUCTURAL RETRIEVAL FROM HIGH-RESOLUTION ELECTRON-MICROGRAPHS

被引：0
|
作者：
VANDYCK, D
DEBEECK, MO
机构：
来源：
COMPUTER SIMULATION OF ELECTRON MICROSCOPE DIFFRACTION AND IMAGES | 1989年
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D O I：
暂无
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
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页码：265 / 271
页数：7
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