共 50 条
- [22] IMAGE QUALITY IMPROVEMENT OF HIGH-RESOLUTION ELECTRON-MICROGRAPHS WITH ASTIGMATISM AND COMA ABERRATIONS BY OPTICAL MEANS OPTIK, 1988, 79 (04): : 171 - 176
- [24] DETECTION OF RANDOM ALLOY FLUCTUATIONS IN HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROGRAPHS OF A1GAAS PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1995, 72 (04): : 1015 - 1030
- [29] THE DESIGN OF A COMPUTER-SYSTEM FOR IMAGE SIMULATION AND IMAGE-PROCESSING OF HIGH-RESOLUTION ELECTRON-MICROGRAPHS COMPUTER SIMULATION OF ELECTRON MICROSCOPE DIFFRACTION AND IMAGES, 1989, : 171 - 183