DIRECT STRUCTURAL RETRIEVAL FROM HIGH-RESOLUTION ELECTRON-MICROGRAPHS

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作者：

VANDYCK, D

DEBEECK, MO

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来源：

COMPUTER SIMULATION OF ELECTRON MICROSCOPE DIFFRACTION AND IMAGES | 1989年

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O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

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页码：265 / 271

页数：7

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