CONTRAST OF A P-N-JUNCTION IN ULTRA HIGH-VACUUM SCANNING ELECTRON-MICROSCOPY

被引：0
|
作者：
DURAUD, JP
LEMOEL, A
LEGRESSUS, C
PANTEL, R
CHORNIK, B
机构：
[1] CNET, CNS, F-38240 MEYLAN, FRANCE
[2] UNIV SIMON BOLIVAR, DEPT CIENCIA MAT, CARACAS, VENEZUELA
来源：
SCANNING ELECTRON MICROSCOPY | 1984年
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：49 / 54
页数：6
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