CONTRAST OF A P-N-JUNCTION IN ULTRA HIGH-VACUUM SCANNING ELECTRON-MICROSCOPY

被引：0

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作者：

DURAUD, JP

LEMOEL, A

LEGRESSUS, C

PANTEL, R

CHORNIK, B

机构：

[1] CNET, CNS, F-38240 MEYLAN, FRANCE

[2] UNIV SIMON BOLIVAR, DEPT CIENCIA MAT, CARACAS, VENEZUELA

来源：

SCANNING ELECTRON MICROSCOPY | 1984年

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D O I：

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中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

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页码：49 / 54

页数：6

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